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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications - Measurement of photoelectrons decay in doping AgCl by microwave absorption phase-sensitive technique
Dai, Xiuhong, Ye, Shenghua, Zhang, Guangjun, Dong, Guoyi, Liu, Haiyan, Ni, Jun, Li, Xiaowei, Yang, Shaopeng, Han, LiVolume:
7160
Year:
2008
Language:
english
DOI:
10.1117/12.806504
File:
PDF, 475 KB
english, 2008