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SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Modeling Aspects in Optical Metrology II - Variable waveplate-based polarimeter for polarimetric metrology
Peinado, Alba, Bosse, Harald, Bodermann, Bernd, Lizana, Angel, Vidal, Josep, Silver, Richard M., Iemmi, Claudio, Márquez, Andrés, Moreno, Ignacio, Campos, JuanVolume:
7390
Year:
2009
Language:
english
DOI:
10.1117/12.828045
File:
PDF, 394 KB
english, 2009