![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, CA (Sunday 2 August 2009)] Instrumentation, Metrology, and Standards for Nanomanufacturing III - Front-side illuminated CMOS spectral pixel response and modulation transfer function characterization: impact of pixel layout details and pixel depletion volume
Bray, Jonathan D., Postek, Michael T., Allgair, John A., Schumann, Lee W., Lomheim, Terrence S.Volume:
7405
Year:
2009
Language:
english
DOI:
10.1117/12.828311
File:
PDF, 12.42 MB
english, 2009