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SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Quantitative measurement of Φ140mm F/2 parabolic surface with Ronchi grating test method
Lei, Bai-ping, Zhang, Yudong, Wu, Fan, Wyant, James C., Smythe, Robert A., Zhou, Chen-bo, Wang, HexinVolume:
7283
Year:
2008
Language:
english
DOI:
10.1117/12.828721
File:
PDF, 1.02 MB
english, 2008