SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Reflection, Scattering, and Diffraction from Surfaces II - Experimental confirmation of the Rayleigh-Rice obliquity factor
Stover, John C., Gu, Zu-Han, Hanssen, Leonard M.Volume:
7792
Year:
2010
Language:
english
DOI:
10.1117/12.858799
File:
PDF, 1.41 MB
english, 2010