SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Effects of different nanostructural ZnS films on the characteristics of organic/inorganic heterostructure devices
Lu, Lifang, Jiang, Ya-Dong, Kippelen, Bernard, Xu, Zheng, Zhang, Fujun, Yu, Junsheng, Zhao, Suling, Wang, Liwei, Zhuo, Zuliang, Gai, XinVolume:
7658
Year:
2010
Language:
english
DOI:
10.1117/12.865573
File:
PDF, 696 KB
english, 2010