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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, United States (Monday 25 April 2011)] Active and Passive Signatures II - Analysis of reflectance characteristics of selected plants
Kaszczuk, Miroslawa, Gilbreath, G. Charmaine, Hawley, Chadwick T., Mierczyk, Zygmunt, Zygmunt, Marek, Piotrowski, Wieslaw, Mierczyk, JadwigaVolume:
8040
Year:
2011
Language:
english
DOI:
10.1117/12.883896
File:
PDF, 293 KB
english, 2011