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SPIE Proceedings [SPIE Fourth International Seminar on Modern Cutting and Measuring Engineering - Beijing, China (Friday 10 December 2010)] Fourth International Seminar on Modern Cutting and Measurement Engineering - A tool management system based on RFID
Wang, Z. G., Xin, Jiezhi, Zhu, Lianqing, Xu, L. D., Cai, D. S., Wang, Zhongyu, Xu, L., Yu, H. H.Volume:
7997
Year:
2010
Language:
english
DOI:
10.1117/12.888028
File:
PDF, 2.73 MB
english, 2010