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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Interferometry XVI: Techniques and Analysis - Improve Fourier transform profilometry by locally area modulating squared binary structured pattern
Lohry, William, Zhang, Song, Schmit, Joanna, Creath, Katherine, Towers, Catherine E., Burke, JanVolume:
8493
Year:
2012
Language:
english
DOI:
10.1117/12.927439
File:
PDF, 701 KB
english, 2012