SPIE Proceedings [SPIE 1985 International Technical Symposium/Europe - Cannes, France (Monday 25 November 1985)] Infrared Technology and Applications - Techniques For Suppressing Optical Interference Errors In Infrared Film Thickness Gauging
Edgar, Roger F., Stay, Bernard J., Baker, Lionel R., Masson, AndreVolume:
590
Year:
1986
Language:
english
DOI:
10.1117/12.952000
File:
PDF, 167 KB
english, 1986