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SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Design and Testing V - The measurement of optical reflector with complex surface using nano-CMM
Wu, Zhichao, Guo, Tong, Chen, Jinping, Fu, Xing, Hu, Xiaotang, Wang, Yongtian, Du, Chunlei, Hua, Hong, Tatsuno, Kimio, Urbach, H. PaulVolume:
8557
Year:
2012
Language:
english
DOI:
10.1117/12.999383
File:
PDF, 2.44 MB
english, 2012