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Eddy Current Model for Nondestructive Evaluation with Thin Cracks
Jiang, Xue, Li, Peijun, Zheng, WeiyingVolume:
38
Language:
english
Journal:
SIAM Journal on Scientific Computing
DOI:
10.1137/15M1015492
Date:
January, 2016
File:
PDF, 591 KB
english, 2016