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Threshold ionization mass spectrometry in the presence of excited silane radicals
Moiseev, T, Chrastina, D, Isella, G, Cavallotti, CVolume:
42
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/42/7/072003
Date:
April, 2009
File:
PDF, 149 KB
english, 2009