A NEGF study of the effect of surface roughness on CMOS...

Journal of Physics Conference Series 2006 / 04 Vol. 35

A NEGF study of the effect of surface roughness on CMOS nanotransistors

Martinez, A, Svizhenko, A, Anantram, M P, Barker, J R, Asenov, A
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Volume:
35
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/35/1/024
Date:
April, 2006
File:
PDF, 516 KB
english, 2006
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