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[IEEE 2016 IEEE 36th International Conference on Electronics and Nanotechnology (ELNANO) - Kyiv, Ukraine (2016.4.19-2016.4.21)] 2016 IEEE 36th International Conference on Electronics and Nanotechnology (ELNANO) - Dose reduction and object measuring in stereo X-ray systems
Miroshnychenko, S. I., Volkov, E. V.Year:
2016
Language:
english
DOI:
10.1109/elnano.2016.7493050
File:
PDF, 2.35 MB
english, 2016