[IEEE 2016 Annual IEEE Systems Conference (SysCon) - Orlando, FL, USA (2016.4.18-2016.4.21)] 2016 Annual IEEE Systems Conference (SysCon) - Troubleshooting optimization using multi-start simulated annealing
Vianna, Wlamir Olivares Loesch, Rodrigues, Leonardo Ramos, Yoneyama, Takashi, Mattos, David IssaYear:
2016
Language:
english
DOI:
10.1109/syscon.2016.7490522
File:
PDF, 510 KB
english, 2016