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[IEEE Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Windsor, UK (2007.09.10-2007.09.14)] Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Improving Evolutionary Testing in the Presence of Function-Assigned Flags

Wappler, Stefan, Baresel, Andre, Wegener, Joachim
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Year:
2007
Language:
english
DOI:
10.1109/taicpart.2007.4344095
File:
PDF, 508 KB
english, 2007
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