Mechanical Properties and Microstructural Characterization...

Mechanical Properties and Microstructural Characterization of Amorphous SiC x N y Thin Films After Annealing Beyond 1100°C

Ctvrtlik, Radim, Kulikovsky, Valeriy, Vorlicek, Vladimir, Tomastik, Jan, Drahokoupil, Jan, Jastrabik, Lubomir, Ctvrtlik, R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
99
Language:
english
Journal:
Journal of the American Ceramic Society
DOI:
10.1111/jace.14057
Date:
March, 2016
File:
PDF, 1.67 MB
english, 2016
Conversion to is in progress
Conversion to is failed