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Automated background subtraction technique for electron energy-loss spectroscopy and application to semiconductor heterostructures
ANGADI, VEERENDRA C, ABHAYARATNE, CHARITH, WALTHER, THOMASVolume:
262
Language:
english
Journal:
Journal of Microscopy
DOI:
10.1111/jmi.12397
Date:
May, 2016
File:
PDF, 1.21 MB
english, 2016