SPIE Proceedings [SPIE IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 6 February 1994)] Machine Vision Applications in Industrial Inspection II - Learning algorithms for both real-time detection of solder shorts and for SPC measurement correction using cross-sectional x-ray images of PCBA solder joints
Roder, Paul A., Dawson, Benjamin M., Wilson, Stephen S., Wu, Frederick Y.Volume:
2183
Year:
1994
Language:
english
DOI:
10.1117/12.171225
File:
PDF, 1.26 MB
english, 1994