SPIE Proceedings [SPIE The Hague '90, 12-16 April - The Hague, Netherlands (Thursday 1 March 1990)] In-Process Optical Measurements and Industrial Methods - Miniaturized FT-IR spectrometer for industrial process measurements
Herrala, Esko, Niemela, Pentti, Hannula, Tapio, Macleod, H. A., Langenbeck, PeterVolume:
1266
Year:
1990
Language:
english
DOI:
10.1117/12.20261
File:
PDF, 197 KB
english, 1990