SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Charge-Coupled Devices and Solid State Optical Sensors V - Radiation-hardened backside-illuminated 512 x 512 charge-coupled device
Bates, Philip A., Levine, Peter A., Sauer, Donald J., Hsueh, Fu-Lung, Shallcross, Frank V., Smeltzer, Ronald K., Meray, Grazyna M., Taylor, Gordon C., Tower, John R., Blouke, Morley M.Volume:
2415
Year:
1995
Language:
english
DOI:
10.1117/12.206514
File:
PDF, 1.11 MB
english, 1995