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SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Optical properties of sol-gel Ba0.7Sr0.3 TiO3 thin films studied by spectroscopic ellipsometry
Suzuki, Iwao, Miyazaki, Masaru, Saitoh, Tadashi, Xiong, Yi-Ming, Yoshizawa, Toru, Yokota, HideshiVolume:
2873
Year:
1996
Language:
english
DOI:
10.1117/12.246236
File:
PDF, 146 KB
english, 1996