SPIE Proceedings [SPIE AeroSense '97 - Orlando, FL (Monday 21 April 1997)] Targets and Backgrounds: Characterization and Representation III - Characterization of clutter in SAR imagery using extended self-similar (ESS) processes
Kaplan, Lance M., Murenzi, Romain, Watkins, Wendell R., Clement, DieterVolume:
3062
Year:
1997
Language:
english
DOI:
10.1117/12.276697
File:
PDF, 615 KB
english, 1997