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SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Grazing Incidence and Multilayer X-Ray Optical Systems - Determination of optical constants for AXAF mirrors from 0.05 to 1.0 keV through reflectance measurements
Harris, Bernard, Burek, Anthony J., Fitch, Jonathan J., Graessle, Dale E., Schwartz, Daniel A., Blake, Richard L., Gullikson, Eric M., Hoover, Richard B., Walker II, Arthur B. C.Volume:
3113
Year:
1997
Language:
english
DOI:
10.1117/12.278876
File:
PDF, 634 KB
english, 1997