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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Recent Developments in Optical Gauge Block Metrology - Case against optical gauge block metrology

Doiron, Theodore D., Everett, Dennis, Faust, Bryon S., Stanfield, Eric S., Stoup, John R., Decker, Jennifer E., Brown, Nicholas
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Volume:
3477
Year:
1998
Language:
english
DOI:
10.1117/12.323108
File:
PDF, 464 KB
english, 1998
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