SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X - Large-area reflection grating spectrometer for the Constellation-X mission
Kahn, Steven M., Paerels, Frits B. S., Peterson, J. R., Rasmussen, Andrew P., Schattenburg, Mark L., Ricker, Jr., George R., Bautz, Mark W., Doty, John P., Prigozhin, Gregory Y., Nousek, John A., BurrVolume:
3765
Year:
1999
Language:
english
DOI:
10.1117/12.366491
File:
PDF, 1.06 MB
english, 1999