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SPIE Proceedings [SPIE 4th International Conference on Thin Film Physics and Applications - Shanghai, China (Monday 8 May 2000)] Fourth International Conference on Thin Film Physics and Applications - Influence of nitrogen defects in AIN coverlayers on thermal stability of DyFeCo MO films
Xiong, Rui, Tang, Wufeng, Shi, Jing, Tian, Deichen, Chu, Junhao, Liu, Pulin, Chang, YongVolume:
4086
Year:
2000
Language:
english
DOI:
10.1117/12.408306
File:
PDF, 214 KB
english, 2000