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SPIE Proceedings [SPIE Laser-Assisted Microtechnology 2000 - St. Petersburg-Pushkin, Russia (Wednesday 23 August 2000)] Laser-Assisted Microtechnology 2000 - Development of information-measuring channels of the monitoring system of quality cut for technological process laser cutting of materials
Sukhov, Yuri T., Matiushin, I. V., Veiko, Vadim P.Volume:
4157
Year:
2001
Language:
english
DOI:
10.1117/12.413740
File:
PDF, 272 KB
english, 2001