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SPIE Proceedings [SPIE Symposium on Integrated Optics - San Jose, CA (Saturday 20 January 2001)] Testing, Reliability, and Applications of Optoelectronic Devices - Coded IR proximity detector
Zisu, Tudor, Miclos, Sorin, Chin, Aland K., Dutta, Niloy K., Linden, Kurt J., Wang, S. C.Volume:
4285
Year:
2001
Language:
english
DOI:
10.1117/12.426877
File:
PDF, 35 KB
english, 2001