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SPIE Proceedings [SPIE Optoelectronic and Electronic Sensors IV - Gliwice, Poland (Tuesday 13 June 2000)] Optoelectronic and Electronic Sensors IV - Method of contour and its characteristic feature extraction from a noisy image

Niedziela, Tadeusz, Baron, Grzegorz, Rogala, Krzysztof, Fraczek, Jerzy
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Volume:
4516
Year:
2001
Language:
english
DOI:
10.1117/12.435903
File:
PDF, 450 KB
english, 2001
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