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SPIE Proceedings [SPIE International Symposium on Optoelectonics and Microelectronics - Nanjing, China (Wednesday 7 November 2001)] Micromachining and Microfabrication Process Technology and Devices - Absorption and emission properties of F-center-OH- defect pairs in cesium halides
Kong, Chunyang, Ma, Y., Dong, M. D., Wang, Wanlu, Liao, Kejun, Xu, J., Tien, Norman C., Huang, Qing-AnVolume:
4601
Year:
2001
Language:
english
DOI:
10.1117/12.444711
File:
PDF, 476 KB
english, 2001