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SPIE Proceedings [SPIE Smart Structures and Materials - San Diego, CA (Sunday 2 March 2003)] Smart Structures and Materials 2003: Smart Sensor Technology and Measurement Systems - BAW and SAW sensors for in situ analysis
Sherrit, Stewart, Bao, Xiaoqi, Bar-Cohen, Yoseph, Chang, Zensheu, Inaudi, Daniele, Udd, EricVolume:
5050
Year:
2003
Language:
english
DOI:
10.1117/12.484252
File:
PDF, 322 KB
english, 2003