SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

  • Main
  • SPIE Proceedings [SPIE Optical...

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - In-line geometric fault detection in car parts based on structured light projection and image processing

Couweleers, Fred, Osten, Wolfgang, Kujawinska, Malgorzata, Skotheim, Oystein, Schulerud, Helene, Creath, Katherine, Kaspersen, Kristin
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.500056
File:
PDF, 742 KB
english, 2003
Conversion to is in progress
Conversion to is failed