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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - In-line geometric fault detection in car parts based on structured light projection and image processing
Couweleers, Fred, Osten, Wolfgang, Kujawinska, Malgorzata, Skotheim, Oystein, Schulerud, Helene, Creath, Katherine, Kaspersen, KristinVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.500056
File:
PDF, 742 KB
english, 2003