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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications - X-ray and EUV spectral instruments for plasma source characterization
Shevelko, Alexander P., Kyrala, George A., Gauthier, Jean-Claude J., Kasyanov, Yuri S., Knight, Larry V., MacDonald, Carolyn A., Khounsary, Ali M., Phillips, James, Turley, R. Steven, Turner, D. ClarkVolume:
5196
Year:
2003
Language:
english
DOI:
10.1117/12.507723
File:
PDF, 211 KB
english, 2003