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SPIE Proceedings [SPIE Speckle Metrology 2003 - Trondheim, Norway (Wednesday 18 June 2003)] Speckle Metrology 2003 - Object-adapted inverse pattern projection: generation, evaluation, and applications
Bothe, Thorsten, Li, Wansong, von Kopylow, Christoph, Juptner, Werner P., Gastinger, Kay, Lokberg, Ole J., Winther, SveinVolume:
4933
Year:
2003
Language:
english
DOI:
10.1117/12.516653
File:
PDF, 571 KB
english, 2003