SPIE Proceedings [SPIE Fifth International Symposium on...

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SPIE Proceedings [SPIE Fifth International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 24 October 2003)] Fifth International Symposium on Instrumentation and Control Technology - Large-area definition of nanoelectrodes by nanoimprint lithography

Wissen, Matthias, Zhang, Guangjun, Zhao, Huijie, Scheer, Hella-Christin, Schulz, Hubert, Wang, Zhongyu, Horstmann, J. T., Scherff, M., Fahrner, Wolfgang R.
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Volume:
5253
Year:
2003
Language:
english
DOI:
10.1117/12.521470
File:
PDF, 1020 KB
english, 2003
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