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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Developments in X-Ray Tomography IV - Automatic geometrical calibration for x-ray microtomography based on Fourier and Radon analysis
Weitkamp, Timm, Bonse, Ulrich, Bleuet, PierreVolume:
5535
Year:
2004
Language:
english
DOI:
10.1117/12.557094
File:
PDF, 200 KB
english, 2004