SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Advances in Optical Data Storage Technology - Test method for evaluating optical disk reliability
Irie, Mitsuru, Xu, Duanyi, Schouhamer Immink, Kees A., Okino, Yoshihiro, Kubo, Takahiro, Shono, KeijiVolume:
5643
Year:
2004
Language:
english
DOI:
10.1117/12.575707
File:
PDF, 544 KB
english, 2004