SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA...

  • Main
  • SPIE Proceedings [SPIE Microlithography...

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Advances in Resist Technology and Processing XXII - Evaluation of a novel photoacid generator for chemically amplified photoresist with ArF exposure

Asakura, Toshikage, Sturtevant, John L., Yamato, Hitoshi, Hintermann, Tobias, Ohwa, Masaki
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
5753
Year:
2005
Language:
english
DOI:
10.1117/12.600327
File:
PDF, 191 KB
english, 2005
Conversion to is in progress
Conversion to is failed