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SPIE Proceedings [SPIE SPIE Third International Symposium on Fluctuations and Noise - Austin, TX (Monday 23 May 2005)] Noise and Information in Nanoelectronics, Sensors, and Standards III - Identifying different types of stochastic processes with the same spectra
Bergou, Janos A., Kim, Jong U., Kish, Laszlo B., Smulko, Janusz M., Dykman, Mark I., Schmera, Gabor, Wang, LijunVolume:
5846
Year:
2005
Language:
english
DOI:
10.1117/12.609503
File:
PDF, 64 KB
english, 2005