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SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic technology, and Artificial Intelligence - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence - Study of the effect of CCD camera noise on microscopic autofocus criteria functions
Yu, Chao, Fang, Jiancheng, Wang, Zhongyu, Wang, Boxiong, Zheng, Hanqing, Luo, Xiuzhi, Zhang, MingzhaoVolume:
6357
Year:
2006
Language:
english
DOI:
10.1117/12.717140
File:
PDF, 273 KB
english, 2006