SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Infrared object detection: the influence of flying altitude and velocity
Yi, Yaxing, Ye, Shenghua, Zhang, Guangjun, Yue, Kaiduan, Yuan, Mei, Ni, Jun, Xie, JianVolume:
7511
Year:
2009
Language:
english
DOI:
10.1117/12.837848
File:
PDF, 308 KB
english, 2009