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SPIE Proceedings [SPIE 10th International Conference on Quality Control by Artificial Vision - Saint-Etienne, France (Tuesday 28 June 2011)] Tenth International Conference on Quality Control by Artificial Vision - Recognizing overlapped particles during a crystallization process from in situ video images for measuring their size distributions
Suleiman Ahmad, Ola, Pinoli, Jean-Charles, Debayle, Johan, Debayle, Johan, Gherras, Nesrine, Gavet, Yann, Gruy, Frédéric, Presles, Benoît, Févotte, Gilles, Lambert, Claude, Pinoli, Jean-CharlesVolume:
8000
Year:
2011
Language:
english
DOI:
10.1117/12.889915
File:
PDF, 820 KB
english, 2011