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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 21 January 2012)] Optoelectronic Interconnects XII - Optical waveguide end roughness in correlation to optical coupling
Kruse, Kevin, Riegel, Nick, Demars, Casey, Middlebrook, Christopher, Roggemann, Michael, Glebov, Alexei L., Chen, Ray T.Volume:
8267
Year:
2012
Language:
english
DOI:
10.1117/12.908847
File:
PDF, 1.47 MB
english, 2012