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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Applications of Digital Image Processing XXXV - Comparative study of resolution improvement of optical intrinsic signal imaging by extracting outlier images during data analysis
Abookasis, David, Meshorer, Yekutiel, Tescher, Andrew G.Volume:
8499
Year:
2012
Language:
english
DOI:
10.1117/12.928034
File:
PDF, 3.47 MB
english, 2012