SPIE Proceedings [SPIE 1986 Quebec Symposium - Quebec City, Canada (Tuesday 3 June 1986)] Optical Testing and Metrology - Photometric Ordering Of Ordinary Moire Fringes
Pekelsky, James R., Xinhong, Ding, Grover, Chander P.Volume:
661
Year:
1986
Language:
english
DOI:
10.1117/12.938596
File:
PDF, 11.00 MB
english, 1986