SPIE Proceedings [SPIE 1987 Symposium on the Technologies for Optoelectronics - Cannes, France (Tuesday 17 November 1987)] Industrial Optoelectronic Measurement Systems Using Coherent Light - Strain Analysis Using TV Speckle Interferometer
El-Ghandoor, H., Hamed, A. M., Fagan, William F.Volume:
863
Year:
1988
Language:
english
DOI:
10.1117/12.943500
File:
PDF, 1.11 MB
english, 1988