SPIE Proceedings [SPIE 1988 Dearborn Symposium - Dearborn, MI (Monday 27 June 1988)] Optical Testing and Metrology II - Optical Surface Inspection Using A Transverse Speckle Detection Technique
Oulamara, A., Tribillon, G., Spajer, M., Duvernoy, J., Grover, Chander P.Volume:
954
Year:
1989
Language:
english
DOI:
10.1117/12.947605
File:
PDF, 233 KB
english, 1989