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SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers - Matricial Formalism For Interfacial Roughness Analysis Of LSMs
Pardo, B., Nevot, L., Andre, J-M, Christensen, Finn E.Volume:
984
Year:
1988
Language:
english
DOI:
10.1117/12.948784
File:
PDF, 344 KB
english, 1988